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Dokumenttyp:
Zeitschriftenaufsatz 
Autor(en):
Becherer, M.; Kiermaier, J.; Breitkreutz, S.; Csaba, G.; Ju, X.; Rezgani, J.; Kießling, T.; Yilmaz, C.; Osswald, P.; Lugli, P.; Schmitt-Landsiedel, D. 
Titel:
On-chip Extraordinary Hall-effect sensors for characterization of nanomagnetic logic devices 
Abstract:
Ferromagnetic Co/Pt films and single-domain magnets are characterized by various types of Extraordinary Hall-Effect (EHE) sensors. The magnetron sputtered multilayer films are annealed and measured in the temperature range of 22 °C ⩽ T ⩽ 75 °C. By focused ion beam (FIB) irradiation, the magnetic properties of the Co/Pt stack are tailored to define both the switching field and the geometry of nanomagnetic single domain dots. A submicron sized EHE-sensor for read-out of field-coupled computing dev...    »
 
Stichworte:
Extraordinary Hall-Effect; Co/Pt multilayer; Magnetic QCA; Field-coupled logic; Ferromagnetic computing 
Zeitschriftentitel:
Solid-State Electronics Volume 54, Issue 9, September 2010, Pages 1027–1032 Selected Papers from the ESSDERC 2009 Conference 
Jahr:
2010 
Jahr / Monat:
2010-09 
Quartal:
3. Quartal 
Monat:
Sep 
Seitenangaben Beitrag:
1027-1032 
Sprache:
en 
Verlag / Institution:
Elsevier B.V.