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Document type:
Konferenzbeitrag 
Author(s):
Erol Koser, Felix Miller, Walter Stechele 
Title:
Matching Detection and Correction Schemes for Soft Error Handling in Sequential Logic 
Keywords:
RELY 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
Euromicro Conference on Digital System Design (DSD) 
Date of congress:
August 26-28 
Year:
2015 
Year / month:
2015-08 
TUM Institution:
Lehrstuhl für Integrierte Systeme