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- Document type:
- Konferenzbeitrag
- Author(s):
- Alyokhin, V.; Elbel, B.; Rothfelder, M.; Pretschner, A.
- Title:
- Coverage Metrics for Continuous Function Charts
- Keywords:
- testing, model, coverage
- Book / Congress title:
- Proc. 15th IEEE Intl. Symp. on Software Reliability Engineering (ISSRE'04)
- Publisher:
- Institute of Electrical & Electronics Engineers (IEEE)
- Year:
- 2004
- Fulltext / DOI:
- doi:10.1109/issre.2004.15
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