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- Document type:
- Konferenzbeitrag
- Author(s):
- Wachutka, G.
- Title:
- Virtual Testing of High Power Devices at the Rim of the Safe Operating Area and Beyond
- Pages contribution:
- 6-11
- Book / Congress title:
- Proceedings of the 26th International Symposium on PowerSemiconductor Devices & IC´s
- Congress (additional information):
- ISPSD´14 - June 15-19, 2014 Waikoloa, Hawaii, USA
- Publisher:
- IEEE
- Year:
- 2014
- Print-ISBN:
- 978-1-4799-2917-7
- Reviewed:
- ja
- Language:
- en
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