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Document type:
Zeitschriftenaufsatz 
Author(s):
Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller- Gritschneder, Sani Nassif, Ulf Schlichtmann, Norbert Wehn 
Title:
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience 
Keywords:
VirTherm 3D 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Journal title:
IEEE Micro 
Year:
2013 
Journal volume:
Volume 33 
Year / month:
2013-07 
Month:
Jul 
Journal issue:
Number 4 
Language:
en 
TUM Institution:
Lehrstuhl für Integrierte Systeme 
Format:
Text