Andreas Herkersdorf, Michael Engel, Michael Glaß, Jörg Henkel, Veit Kleeberger, Michael Kochte, Johannes Maximilian Kühn, Sani Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich
Title:
Cross- Layer Dependability Modeling and Abstraction in Systems on Chip
Keywords:
VirTherm 3D
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
Workshop on Silicon Errors in Logic – System Effects (SELSE)