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Autor(en):
Becherer, M.; Kiermaier, J.; Breitkreutz, S.; Csaba, G.; Ju, X.; Rezgani, J.; Kießling, T.; Yilmaz, C.; Osswald, P.; Lugli, P.; Schmitt-Landsiedel, D. 
Titel:
On-chip Extraordinary Hall-effect sensors for characterization of nanomagnetic logic devices 
Abstract:
Ferromagnetic Co/Pt films and single-domain magnets are characterized by various types of Extraordinary Hall-Effect (EHE) sensors. The magnetron sputtered multilayer films are annealed and measured in the temperature range of 22 C [less-than-or-equals, slant] T [less-than-or-equals, slant] 75 C. By focused ion beam (FIB) irradiation, the magnetic properties of the Co/Pt stack are tailored to define both the switching field and the geometry of nanomagnetic single domain dots. A submicron sized EH...    »
 
Stichworte:
Extraordinary Hall-Effect 
Kongresstitel:
Selected Papers from the ESSDERC 2009 Conference 
Zeitschriftentitel:
Solid-State Electronics 
Jahr:
2010 
Band / Volume:
54 
Monat:
sep 
Heft / Issue:
Seitenangaben Beitrag:
1027–1032