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Image title:
Schematic of the new nano-CT method. 
Image explanation:
The sample is scanned with an X-ray beam while the detector records a diffraction pattern for every beam position. The sample is then turned around its axis and scanned again, until a complete set of data is gathered for every angle. A high-resolution three-dimensional image of the sample is then computed from the hundreds of thousands of diffraction patterns by means of specially developed image reconstruction algorithms. 
Event:
Publication in Nature, Sept. 23, 2010 
Individual people:
M. Dierolf, P. Thibault, F. Pfeiffer 
Keywords:
Pfeiffer, Thibault, Dierolf, nano-CT, X-Ray, Physics, PSI, ETHZ 
Faculty:
Physics 
Chair / Science unit:
Biomedical Physics (E17) 
TUM unit:
Physics Department 
TUM location:
Garching 
Event date / year:
2010 
Document type:
Image 
Source:
TUM Mitarbeiter