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Autor(en):
Greitemann, J.; Stahl, B.; Michels, N. V.; Lohmann, B.; Reinhart, G.
Titel:
Quantitative Model of the Technology Lifecycle for Forecasting the Maturity of Manufacturing Technologies
Kongress- / Buchtitel:
7th IEEE International Conference on Management of Innovation and Technology (ICMIT)
Verlagsort:
Singapore
Jahr:
2014
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