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Author(s):
Glaß, Michael; Lukasiewycz, Martin; Haubelt, Christian; Teich, Jürgen 
Title:
Incorporating Graceful Degradation into Embedded System Design 
Book / Congress title:
Proceedings of the Conference on Design, Automation and Test in Europe (DATE) 
Publisher address:
Nice, France 
Year:
2009 
Pages:
320--323