Login
- Author(s):
- Fischer, T.; Amirante, E.; Huber, P.; Nirschl, T.; Olbrich, A.; Ostermayr, M.; Schmitt-Landsiedel, D.
- Title:
- Analysis of read current and write trip voltage variability from a 1 MBit SRAM test structure
- Journal title:
- IEEE Transactions on Semiconductor Manufacturing
- Year:
- 2008
- Journal volume:
- 21
- Month:
- Nov.
- Journal issue:
- 4
- Pages contribution:
- 534-541
- Language:
- emglish
BibTeX