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Author(s):
Fischer, T.; Amirante, E.; Huber, P.; Nirschl, T.; Olbrich, A.; Ostermayr, M.; Schmitt-Landsiedel, D. 
Title:
Analysis of read current and write trip voltage variability from a 1 MBit SRAM test structure 
Journal title:
IEEE Transactions on Semiconductor Manufacturing 
Year:
2008 
Journal volume:
21 
Month:
Nov. 
Journal issue:
Pages contribution:
534-541 
Language:
emglish