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Author(s):
Fischer, T.; Amirante, E.; Hofmann, K.; Ostermayr, M.; Huber, P.; Schmitt-Landsiedel, D. 
Title:
A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors 
Book / Congress title:
IEEE Proceedings of 38th European Solid-State Device Research Conference ESSDERC 
Year:
2008 
Month:
15-19 Sept. 
Pages:
51-54