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document type:
congress contribution (original) 
title:
Built-in self test architectures for multistage interconnection networks 
authors:
Bernard, E.; Simon, S.; Nossek, J.A. 
pages:
176-180 
congress title:
European Design and Test Conference 
additional information:
Paris, France 
year:
1996 
month:
March 
language:
en 
TUM-institution:
Institute for Circuit Theory and Signal Processing 
ingested:
28.01.2009 
format:
text