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Document type:
Konferenzbeitrag 
Contribution type:
Vortrag / Präsentation 
Author(s):
Fischer, Thomas 
Title:
Statistical effects of NBTI degradation in SRAM cells 
Book / Congress title:
Muneda User Group Meeting 2008 
Congress (additional information):
München 
Date of publication:
13.11.2008 
Year:
2008 
Language:
en 
TUM Institution:
Lehrstuhl für Technische Elektronik 
Format:
Text