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Document type:
Konferenzbeitrag 
Contribution type:
Vortrag / Präsentation 
Author(s):
Fischer, Thomas; Amirante, Ettore; Hofmann, Karl; Ostermayr, Martin; Huber, Peter; Schmitt-Landsiedel, Doris 
Title:
Test structures for SRAM cell and device variability and the statistics of NBTI degradation 
Book / Congress title:
Workshop on Variation Test Structures at ICCAD 
Congress (additional information):
San Jose, USA 
Date of publication:
13.11.2008 
Year:
2008 
Language:
en 
TUM Institution:
Lehrstuhl für Technische Elektronik 
Format:
Text