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Document type:
Zeitschriftenaufsatz 
Author(s):
Fischer, Thomas; Amirante, Ettore; Hofmann, Karl; Ostermayr, Martin; Huber, Peter; Schmitt-Landsiedel, Doris 
Title:
A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors 
Journal title:
Proc. of ESSDERC 
Year:
2008 
Pages contribution:
51-54 
Language:
de 
TUM Institution:
Lehrstuhl für Technische Elektronik 
Format:
Text