The densely integrated electronic devices require ultra-low level of the bit error rate (BER). A huge number of the experiments provides BER estimation using statistical signal processing in multi-conductor transmission lines. In this paper the probabilistic model of the combined victim signal and crosstalk voltage is presented. The proposed approach allows to estimate statistical characteristics of different voltage trajectories of measured signals in the transmission lines. The experimental investigation of BERs for different bit rates is performed.     «

The densely integrated electronic devices require ultra-low level of the bit error rate (BER). A huge number of the experiments provides BER estimation using statistical signal processing in multi-conductor transmission lines. In this paper the probabilistic model of the combined victim signal and crosstalk voltage is presented. The proposed approach allows to estimate statistical characteristics of different voltage trajectories of measured signals in the transmission lines. The experimental in...     »