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- Document type:
- Konferenzbeitrag
- Author(s):
- Rempe, A.-S.; Kindersberger, J.; Willner, E.-M.; Dietz, H.
- Title:
- Determination of Interphase Thickness in Silicone Nanocomposites from Dielectric Properties
- Book / Congress title:
- 2020 IEEE 3rd International Conference on Dielectrics
- Congress (additional information):
- Virtual Edition
- Organization:
- Instituto de Tecnologia Electrica (ITE), Valencia, Spain
- Date of congress:
- 06.07.2020 - 31.07.2020
- Year:
- 2020
- Reviewed:
- ja
- Language:
- en
- TUM Institution:
- HSA
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