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Document type:
Zeitschriftenaufsatz
Author(s):
Becherer, M.; Kiermaier, J.; Breitkreutz, S.; Csaba, G.; Ju, X.; Rezgani, J.; Kießling, T.; Yilmaz, C.; Osswald, P.; Lugli, P.; Schmitt-Landsiedel, D.
Title:
On-chip Extraordinary Hall-effect sensors for characterization of nanomagnetic logic devices
Abstract:
Ferromagnetic Co/Pt films and single-domain magnets are characterized by various types of Extraordinary Hall-Effect (EHE) sensors. The magnetron sputtered multilayer films are annealed and measured in the temperature range of 22 °C ⩽ T ⩽ 75 °C. By focused ion beam (FIB) irradiation, the magnetic properties of the Co/Pt stack are tailored to define both the switching field and the geometry of nanomagnetic single domain dots. A submicron sized EHE-sensor for read-out of field-coupled computing dev...     »
Keywords:
Extraordinary Hall-Effect; Co/Pt multilayer; Magnetic QCA; Field-coupled logic; Ferromagnetic computing
Journal title:
Solid-State Electronics Volume 54, Issue 9, September , Pages 1027–1032 Selected Papers from the ESSDERC Conference 2010-09
Year:
2010
Year / month:
2010-09
Quarter:
3. Quartal
Month:
Sep
Pages contribution:
1027-1032
Language:
en
Fulltext / DOI:
doi:10.1016/j.sse.2010.04.011
WWW:
http://www.sciencedirect.com/science/article/pii/S0038110110001280
Publisher:
Elsevier B.V.
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