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Document type:
Zeitschriftenaufsatz 
Author(s):
Weitkamp, T.; Zanette, I.; Schulz, G.; Bech, M.; Rutishauser, S.; Lang, S.; Donath, T.; Tapfer, A.; Deyhle, H.; Bernard, P.; Valade, J.‐P.; Reznikova, E.; Kenntner, J.; Mohr, J.; Müller, B.; Pfeiffer, F.; David, C.; Baruchel, J. 
Title:
X‐ray Grating Interferometry at ESRF: Applications and Recent Technical Developments 
Journal title:
AIP Conference Proceedings 
Year:
2011 
Journal volume:
1365 
Pages contribution:
28-31 
Fulltext / DOI: