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Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Szwajca, A.; Wei, J.; Schukfeh, M.I.; Tornow, M.
Titel:
Self-assembled monolayers of alkyl-thiols on InAs: A Kelvin probe force microscopy study
Abstract:
We report on the preparation and characterization of self-assembled monolayers from aliphatic thiols with different chain length and termination on InAs (100) planar surfaces. This included as first step the development and investigation of a thorough chemical InAs surface preparation step using a dedicated bromine/NH4OH-based etching process. Ellipsometry, contact angle measurements and atomic force microscopy (AFM) indicated the formation of smooth, surface conforming monolayers. The molecular...     »
Stichworte:
Self-assembled monolayers Thiols InAs Surface analysis Kelvin probe force microscopy
Zeitschriftentitel:
Surface Science Volume 633, Pages 53-59 2015-03
Jahr:
2015
Jahr / Monat:
2015-03
Quartal:
1. Quartal
Monat:
Mar
Sprache:
en
Volltext / DOI:
doi:10.1016/j.susc.2014.11.023
WWW:
https://www.sciencedirect.com/science/article/pii/S0039602814003690
Verlag / Institution:
Elsevier B.V.
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