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Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Vortrag / Präsentation
Autor(en):
Hiller, Matthias and Önalan, Aysun Gurur and Sigl, Georg and Bossert, Martin
Titel:
Online Reliability Testing for PUF Key Derivation
Seitenangaben Beitrag:
8 pages
Abstract:
Physical Unclonable Functions (PUFs) measure manufacturing variations inside integrated circuits to derive internal secrets during run-time and avoid to store secrets permanently in non-volatile memory. PUF responses are noisy such that they require error correction to generate reliable cryptographic keys. To date, when needed one single key is reproduced in the field and always used, regardless of its reliability. In this work, we compute online reliability information for a reproduced key a...     »
Stichworte:
Physical Unclonable Functions; Syndrome Coding; Secret Key Derivation; Coding Theory.
Dewey-Dezimalklassifikation:
620 Ingenieurwissenschaften
Kongress- / Buchtitel:
6th International Workshop on Trustworthy Embedded Devices TrustED 2016
Kongress / Zusatzinformationen:
Vienna, Austria
Datum der Konferenz:
10/2016
Jahr:
2016
Quartal:
4. Quartal
Jahr / Monat:
2016-10
Monat:
Oct
Reviewed:
ja
Sprache:
en
Volltext / DOI:
doi:10.1145/2995289.2995293
WWW:
http://doi.acm.org/10.1145/2995289.2995293
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