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- Author(s):
- Tabacaru, Bogdan Andrei; Chaari, Moomen; Ecker, Wolfgang; Kruse, Thomas; Novello, Cristiano
- Title:
- {Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed}
- Journal title:
- ERCIM/EWICS/ARTEMIS Workshop on ``Dependable Embedded and Cyber-physical Systems and Systems-of-Systems'' (DECSoS'16)
- Year:
- 2016
- Pages contribution:
- 1--13
- Fulltext / DOI:
- doi:10.1007/978-3-319-45480-1_12
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