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Author(s):
Stockmar, Marco; Zanette, Irene; Dierolf, Martin; Enders, Bjoern; Clare, Richard; Pfeiffer, Franz; Cloetens, Peter; Bonnin, Anne; Thibault, Pierre 
Title:
X-Ray Near-Field Ptychography for Optically Thick Specimens 
Journal title:
Physical Review Applied 
Year:
2015 
Journal volume:
Journal issue:
Publisher:
American Physical Society (APS) 
E-ISSN:
2331-7019 
Date of publication:
21.01.2015