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Image title:
Daniela Pfister at the X-ray diffractometer
Image explanation:
First author Daniela Pfister measuring a sample of SnIP at the X-ray-diffractometer
Event:
Press release Sept. 12, 2016
Individual people:
Daniela Pfister
Keywords:
Semiconductor; flexible; double helix; phosphorous; tin; iodine; SnIP; nano; material; one-dimensional
Faculty:
Chemistry
Chair / Science unit:
Work group for synthesis and characterization of innovative materials
TUM location:
Garching
Event date / year:
25.08.2016
Document type:
Image
Source:
TUM Fotostelle
Original File:
/file/1324633/20160825_Pfister_Daniela_AH_261605.jpg