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Image title:
Daniela Pfister at the X-ray diffractometer 
Image explanation:
First author Daniela Pfister measuring a sample of SnIP at the X-ray-diffractometer 
Event:
Press release Sept. 12, 2016 
Individual people:
Daniela Pfister 
Keywords:
Semiconductor; flexible; double helix; phosphorous; tin; iodine; SnIP; nano; material; one-dimensional 
Faculty:
Chemistry 
Chair / Science unit:
Work group for synthesis and characterization of innovative materials 
TUM location:
Garching 
Event date / year:
25.08.2016 
Document type:
Image 
Source:
TUM Fotostelle