User: Guest  Login
Author(s):
Barke, Martin; Schlichtmann, Ulf 
Title:
A Cross-Layer Approach to Measure the Robustness of Integrated Circuits 
Journal title:
ACM Journal on Emerging Technologies in Computing Systems (JETC) - Special Issue on Cross-Layer System Design and Regular Papers 
Year:
2015 
Journal volume:
12 
Month:
sep 
Journal issue: