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Autor(en):
Barke, Martin; Schlichtmann, Ulf 
Titel:
A Cross-Layer Approach to Measure the Robustness of Integrated Circuits 
Zeitschriftentitel:
ACM Journal on Emerging Technologies in Computing Systems (JETC) - Special Issue on Cross-Layer System Design and Regular Papers 
Jahr:
2015 
Band / Volume:
12 
Monat:
sep 
Heft / Issue: