User: Guest  Login
Author(s):
Barke, Martin; Kaergel, Michael; Olbrich, Markus; Schlichtmann, Ulf 
Title:
Robustness Measurement of Integrated Circuits and its Adaptation to Aging Effects 
Journal title:
Microelectronics Reliability 
Year:
2014 
Journal volume:
54 
Month:
jun 
Journal issue:
6-7 
Pages contribution:
1058-1065