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Author(s):
Herkersdorf, Andreas; Aliee, Hananeh; Engel, Michael; Glaß, Michael; Gimmler-Dumont, Christina; Henkel, Jörg; Kleeberger, Veit B.; Kochte, Michael A.; Kühn, Johannes M.; Mueller-Gritschneder, Daniel; Nassif, Sani R.; Rauchfuss, Holm; Rosenstiel, Wolfgang; Schlichtmann, Ulf; Shafique, Muhammad; Tahoori, Mehdi B.; Teich, Jürgen; Wehn, Norbert; Weis, Christian; Wunderlich, Hans-Joachim 
Title:
Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience 
Journal title:
Microelectronics Reliability 
Year:
2014 
Journal volume:
54 
Month:
jun 
Journal issue:
6-7 
Pages contribution:
1066-1074