Benutzer: Gast  Login
Dokumenttyp:
Konferenzbeitrag 
Autor(en):
Kleeberger, Veit; Dorfner, Magdalena; Schlichtmann, Ulf 
Titel:
Evaluation of Sequential Circuit Resilience in Early Design Stages 
Abstract:
Future technologies are more sensitive to manufacturing and environmental variations as process technology scaling intensifies the influences of physical effects, e.g. random dopant fluctuations. To better consider these effects also in early design stages new models are required that allow to evaluate the influence of these effects. This papers demonstrates the development of an analytical model for evaluation of the influence of technology-level effects in sequential circuits. The model target...    »
 
Kongress- / Buchtitel:
edaWorkshop 14 - Tagungsband 
Konferenzort:
Hannover 
Datum der Konferenz:
13.05.2014 - 14.05.2014 
Verlag / Institution:
VDE-Verlag 
Jahr:
2014 
TUM Einrichtung:
Lehrstuhl für Entwurfsautomatisierung