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Document type:
Konferenzbeitrag 
Author(s):
Kleeberger, Veit; Dorfner, Magdalena; Schlichtmann, Ulf 
Title:
Evaluation of Sequential Circuit Resilience in Early Design Stages 
Abstract:
Future technologies are more sensitive to manufacturing and environmental variations as process technology scaling intensifies the influences of physical effects, e.g. random dopant fluctuations. To better consider these effects also in early design stages new models are required that allow to evaluate the influence of these effects. This papers demonstrates the development of an analytical model for evaluation of the influence of technology-level effects in sequential circuits. The model target...    »
 
Book / Congress title:
edaWorkshop 14 - Tagungsband 
Date of congress:
13.05.2014 - 14.05.2014 
Publisher:
VDE-Verlag 
Year:
2014 
TUM Institution:
Lehrstuhl für Entwurfsautomatisierung