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- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Alyokhin, V.; Elbel, B.; Rothfelder, M.; Pretschner, A.
- Titel:
- Coverage Metrics for Continuous Function Charts
- Stichworte:
- testing, model, coverage
- Kongress- / Buchtitel:
- Proc. 15th IEEE Intl. Symp. on Software Reliability Engineering (ISSRE'04)
- Verlag / Institution:
- Institute of Electrical & Electronics Engineers (IEEE)
- Jahr:
- 2004
- Volltext / DOI:
- doi:10.1109/issre.2004.15
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