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Document type:
Konferenzbeitrag
Author(s):
Philipps, J.; Pretschner, A.; Slotosch, O.; Aiglstorfer, E.; Kriebel, S.; Scholl, K.
Title:
Model-Based Test Case Generation for Smart Cards1 1Support by the BMBF (project EMPRESS) is gratefully acknowledged.
Pages contribution:
170-184
Keywords:
testing, model
Book / Congress title:
Electronic Notes in Theoretical Computer Science
Publisher:
Elsevier BV
Date of publication:
01.08.2003
Year:
2003
Fulltext / DOI:
doi:10.1016/s1571-0661(04)80817-x
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