Benutzer: Gast  Login
Dokumenttyp:
journal article 
Autor(en):
Malecki, Andreas; Eggl, Elena; Schaff, Florian; Potdevin, Guillaume; Baum, Thomas; Garcia, Eduardo Grande; Bauer, Jan S; Pfeiffer, Franz 
Titel:
Correlation of X-ray dark-field radiography to mechanical sample properties. 
Abstract:
The directional dark-field signal obtained with X-ray grating interferometry yields direction-dependent information about the X-ray scattering taking place inside the examined sample. It allows examination of its morphology without the requirement of resolving the micrometer size structures directly causing the scattering. The local morphology in turn gives rise to macroscopic mechanical properties of the investigated specimen. In this study, we investigate the relation between the biomechanical...    »
 
Zeitschriftentitel:
Microsc Microanal 
Jahr:
2014 
Band / Volume:
20 
Heft / Issue:
Seitenangaben Beitrag:
1528-33 
Sprache:
eng 
Print-ISSN:
1431-9276 
TUM Einrichtung:
Institut für Radiologie; Abteilung für Neuroradiologie