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Autor(en):
Russer, Johannes A.; Ramachandran, Aravind; Cangellaris, Andreas C.; Russer, Peter 
Titel:
Phenomenological Modeling of Passive Intermodulation (PIM) due to Electron Tunneling at Metallic Contacts 
Abstract:
A methodology is proposed for the phenomenological modeling of passive intermodulation (PIM) generation due to electron tunneling in metallic contacts in the signal transmission path of an RF/microwave system. The proposed model aims at enhancing the understanding of this type of PIM source through the investigation of the impact of surface roughness and skin effect on the levels and frequency dependence of PIM interference. Furthermore, the proposed methodology is such that it provides for the...    »
 
Stichworte:
electrical contacts, electromagnetic wave interference, electron tunneling, intermodulation, metallic contacts, non-linear circuit simulation, nonlinear circuit simulators, Passive intermodulation, PIM interference, PIM source models, RF/microwave system, signal transmission path, skin effect, surface roughness, transient electromagnetic field solvers, tunnelling 
Kongress- / Buchtitel:
IEEE MTT-S International Microwave Symposium 
Verlagsort:
San Francisco, CA, USA 
Jahr:
2006 
Monat:
jun 
Seiten:
1129--1132 
Print-ISBN:
0149-645X