Thermal Time Constant Extraction for HBTs from S-Parameter Measurements
Abstract In this letter we present aï¿œnovel approach to extract the thermal time constant of HBTs from S-parameter data. The method is based on aï¿œcalculation of the frequency dependent negative output conductance of the devices due to self-heating effects. It is derived both analytically as well as from an electro-thermal feedback model. Finally, experimental results of SiGe HBTs are given.
Output conductance, Parameter extraction, SiGe HBT, Thermal time constant
AEÜ - International Journal of Electronics and Communications