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Autor(en):
Sinnesbichler, Franz X.; Fischer, M.; Olbrich, Gerhard R. 
Titel:
Accurate Extraction Method For 1/f-Noise Parameters Used in Gummel-Poon Type Bipolar Junction Transistor Models 
Abstract:
In SPICE Gummel-Poon models one 1/f-noise source describes the low frequency noise behaviour of bipolar junction transistors (BJTs). In this paper we present a method to extract the respective model parameters from measured 1/f-noise data without the requirement of exactly determining the corner frequency ftextlesssubtextgreaterctextless/subtextgreater, i.e. the frequency at which the 1/f-noise equals the device noise floor. This novel method is applicable to low-noise as well as to very noisy d...    »
 
Stichworte:
1/f noise, active device, bipolar junction transistor, bipolar transistors, oscillator, Parameter extraction, phase noise, semiconductor device models, semiconductor device noise, SPICE, SPICE Gummel-Poon model 
Kongress- / Buchtitel:
IEEE MTT-S International Microwave Symposium 
Band / Teilband / Volume:
Verlagsort:
Baltimore, MD, USA 
Jahr:
1998 
Monat:
jun 
Seiten:
1345--1348