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Autor(en):
Aryan, Nasim Pour; Listl, Alexandra; Heiss, Leonhard; Yilmaz, Cenk; Georgakos, Georg; Schmitt-Landsiedel, Doris 
Titel:
Digital CMOS Circuit Characterization in terms of Lifetime Reliability 
Kongress- / Buchtitel:
WIP session, 51st Design Automation Conference (DAC) 
Jahr:
2014