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Document type:
Konferenzbeitrag 
Author(s):
Sandow, C.; Baburske, R.; Niedernostheide, F.-J.; Pfirsch, F.; Toechterle, C. 
Title:
Exploring the Limits of the Safe Operation Area of Power Semiconductor Devices 
Pages contribution:
pp. 49-52 
Book / Congress title:
Proceedings of the International Conference on Simulation of Semiconductor Processe and Devices 
Congress (additional information):
SISPAD 2014, September 9-11, Yokohama, Japan 
Year:
2014 
Language:
en