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Document type:
Konferenzbeitrag 
Contribution type:
Vortrag / Präsentation 
Author(s):
Manich, Salvador and Wamser, Markus Guillen, Oscar and Sigl, Georg 
Title:
Differential Scan-Path: A Novel Solution for Secure Design-for-Testability 
Abstract:
In this paper, we present a new scan-path structure for improving the security of systems including scan paths, which normally introduce a security critical information leak channel into a design. Our structure, named differential scan path (DiSP), divides the internal state of the scan path in two sections. During the shift-out operation, only subtraction of the two sections is provided. Inferring the internal state from this subtraction requires much guesswork that increases exponen-tially wit...    »
 
Keywords:
security, testability, scan path, attack, BILBO 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
Test Conference (ITC), 2013 IEEE International 
Congress (additional information):
Anaheim, USA 
Publisher:
IEEE 
Year:
2013 
Year / month:
2013-09 
Month:
Sep 
Pages:
1 - 9 
Print-ISBN:
1089-3539 
Reviewed:
ja 
Language:
en