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- Author(s):
- Olbrich, Gerhard R.; Schenk, T.
- Title:
- Measurement of 1/f Noise on Microwave Transistors
- Book / Congress title:
- URSI International Symposium on Signals, Systems, and Electronics (ISSSE)
- Volume:
- 1
- Publisher address:
- Paris, France
- Year:
- 1992
- Month:
- sep
- Pages:
- 772--775
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